Presentation slides for the ISTFA 2024 Tutorial session “A Practical Tutorial on ATE-Based Electrical Fault Isolation of Digital SoCs Using Photon Emission and Laser Voltage Imaging/Probing (2024 Update).”

automated test equipment, digital system on chips, electrical fault isolation, laser voltage imaging, laser voltage probing, photon emission
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2024
ASM International
Topics
Semiconductor wafer fabrication
Issue Section:
Fault Isolation
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