Abstract
We introduce a novel piece of hardware that allows researchers to extend a nanomanipulator needle further into the vacuum chamber of a dual beam FIB SEM without venting the system. This hardware innovation will elevate throughput and diminish the instrument's downtime, which is pivotal for transmission electron microscope (TEM) sample preparation—a process integral to semiconductor manufacturers where the demand for TEM samples is high due to their necessity for process characterization and failure analysis of integrated circuits. Traditionally, the manipulator needle shortens with each sample preparation, ultimately reaching a mechanical limit that necessitates system venting to install a new needle. This hardware innovation allows users to feed out more needle length into the vacuum chamber by twisting a knob on the outside of the FIB SEM.
