Voltage Contrast within Electron Microscopy—From a Curious Effect to Debugging Modern ICs

ISTFA 2023

November 12–16, 2023

Phoenix, Arizona, USA

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PROCEEDINGS PAPER

James S. Vickers

Thermo Fisher Scientific Fremont

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Fremont, California, USA

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Paper No: istfa2023tpn1, pp. n1-n51; 51 pages

https://doi.org/10.31399/asm.cp.istfa2023tpn1

Published Online: November 12 2023

Abstract

Presentation slides for the ISTFA 2023 Tutorial session “Voltage Contrast within Electron Microscopy- From a Curious Effect to Debugging Modern ICs.”

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2023

ASM International

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