Analog Quiescent Current as Efficient Method for Accurate Fault Isolation in Complex Functional Failures

Analog fault localization for functional failures is usually a very complex task, especially because a deep knowledge of all the functionalities of the device is often required. In addition, when the part is analyzed in application conditions, the interpretation of the anomalous emissions in the failed part and its link to the failing elementary component is not so obvious. The adoption of the analog quiescent current (IDDa) allows to address directly the failing elementary component inside the suspected block.