Basics and Current Aspects of Scanning Electron Microscopy

This presentation addresses topics of relevance to scanning electron microscopy, including SEM basics, electron guns, electron optics, beam-specimen interactions, signal detection, sample prep and cleanliness, low-voltage imaging, nonconductive imaging, voltage contrast, stage biasing, electron channeling contrast imaging, magnetic contrast imaging, STEM-in-SEM, 3D imaging and analytics, and image post-processing.