Abstract
This presentation addresses topics of relevance to scanning electron microscopy, including SEM basics, electron guns, electron optics, beam-specimen interactions, signal detection, sample prep and cleanliness, low-voltage imaging, nonconductive imaging, voltage contrast, stage biasing, electron channeling contrast imaging, magnetic contrast imaging, STEM-in-SEM, 3D imaging and analytics, and image post-processing.
This content is only available as a PDF.
Copyright © 2021 ASM International. All rights reserved.
2021
ASM International
Issue Section:
Microscopy
You do not currently have access to this content.