Abstract
With the 3D stack-die technology, top die and base die are stacked together with micro-bumps for die-to-die interconnection and a through silicon via (TSV) for die-to-package connection. This technology provides tremendous flexibility as designers seek to "mix and match" technology IP blocks with various memory and I/O elements in novel device form factors. Even though the lock-in thermal detection technique had been demonstrated as a useful debug technique to detect defects on packages or pin related fails on 3D stack-die configuration, it is difficult to apply this technique to do functional debug. This paper presents a novel base die debug technique with TSV wirebond for 3D stack-die devices. A comprehensive study on the base die debug flow with real failing cases is also presented. Base die debug techniques will need to continue to be innovated to provide complete debug solutions for such platform.
