High quality and reliability are paramount for automotive and other high grade commercial applications. The implementation of scan testing including stuck-at, transition, IDDQ, bridging and cell-aware patterns have all been targeted at reducing the number of defective parts being shipped. These techniques are not always sufficient to achieve sub defective parts per million (DPPM) quality levels. This paper presents a recurring failure mechanism that was encountered on an automotive device and the subsequent efforts to expand upon existing testing methodologies to effectively screen the defective devices using a delta IDDQ method with specific logic inputs and outputs. In effect, this new testing becomes a cell-aware delta IDDQ targeting one specific input condition that was implemented in production with limited test time overhead.

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