Laser Assisted Device Alteration (LADA) or Soft Defect Localization (SDL) is commonly used to root cause device marginality due to functional or structural failures. At a high level, LADA involves setting the device under test (DUT) at its marginal state and using focused near infra-red laser beams to perturb sensitive circuitry [1]. Scanning the focused laser beam over the die can be a long and time-consuming process. In this paper, two LADA cases are presented, which involve a parametric measurement failure while running a dynamic ATE test. Using LADA technique, these two cases were root caused. These two cases also explain how a parametric measurement-based LADA can be setup on ATE, as well as a synchronization method independent of vectors in a pattern. Synchronization was necessitated in the 2nd case due to the asymmetric test program loop, as well as the long test program cycle time. There are many factors which impact LADA turnaround time and it can take anywhere between few seconds to one day. The two major factors are the size of the Area of Interest (AOI) and test program cycle time. Test program cycle time influences the laser “dwell time” for LADA. Dwell time, in simple terms, is the total time the laser is parked at each pixel. The laser can also be synchronized with the test program cycle, keeping the two always in phase. This is explained in Case 2, where LADA synchronization was implemented, and the analysis was successfully completed in time, even though the test cycle time was very long.

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