Abstract

Battelle has developed a technology to nondestructively classify electronic components as authentic or counterfeit. The technology uses a method that creates feature vectors for each class of devices using a reconfigurable side channel power analysis test fixture. This test fixture monitors the power fluctuations of the device either via connection to a power or a ground pin while test signals are sent to the device. Power waveforms are processed, undergo dimensionality reduction techniques, and the resultant data is plotted in Principal Component Analysis (PCA) space to reveal information related to the authenticity of the device under test. To scale this technology to the full catalog of parts available to a production test house, unique tools have been created that provide automated test generation and scoring of feature vectors.

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