We present a new, non-destructive electrical technique, Power Spectrum Analysis (PSA). PSA as described here uses off-normal biasing, an unconventional way of powering microelectronics devices. PSA with off-normal biasing can be used to detect subtle differences between microelectronic devices. These differences, in many cases, cannot be detected by conventional electrical testing. In this paper, we highlight PSA applications related to aging and counterfeit detection.

aging sensors, counterfeit detection, failure analysis, microelectronics devices, power spectrum analysis
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Copyright © 2017 ASM International. All rights reserved.
2017
ASM International
Topics
Semiconductor wafer fabrication Test method evaluation
Issue Section:
Counterfeit Microelectronics
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