In this paper, different failure analysis (FA) workflows are showed which combines different FA approaches for fast and efficient fault isolation and root cause analysis in system level products. Two case studies will be presented to show the importance of a well-adjusted failure analysis workflow.

automotive industry, electronic systems, fault isolation, root cause analysis
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Copyright © 2017 ASM International. All rights reserved.
2017
ASM International
Topics
Semiconductor wafer fabrication Root cause analysis
Issue Section:
System Level Analysis
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