Electrical failure analysis (EFA) is usually time consuming and expensive. It is a critical step bridging data failure analysis (DFA) and physical failure analysis (PFA). This paper presents experiments on using volume scan diagnosis as a component in building up an efficient EFA solution for digital circuits and discusses practical considerations in the production yield flow. It provides a brief review of the existing methods and the requirement to build an efficient flow, followed by a discussion on the proposed solution. The proposed solution can be used systematically in different stages of the production yield flow. The paper then shows industrial case studies and their results and benefits.