A customized test resource has been created on Linux based automated test system to enhance and accelerate diagnostics and fault localization on random access memory. The resource, Targeted Memory Test, allows creation of a user defined sub-array which targets a specific area of a memory array. The resource includes a customized pattern set which can then be used with the unique Advanced Characterization shmoo plot routine to fully characterize any given failure mode. The sub-array patterns and characterization data can provide a clear understanding of the failure and reduce the time needed for both fault localization and physical failure analysis.
This content is only available as a PDF.
Copyright © 2017 ASM International. All rights reserved.
Issue Section:Product Yield, Test, and Diagnostics