Optimizing Ex-Situ Lift Out for Frontside or Backside FIB Milling Available to Purchase

Ex situ lift out is fast, easy, and reproducible, and adds flexibility for either frontside or backside manipulation of focused ion beam milled specimens. ex situ lift out methods may be enhanced by eliminating electrostatic forces. In addition, optimizing the geometry of the specimen relative to the probe improves the Van der Waals forces responsible for the lift out and subsequent manipulation of focused ion beam prepared specimens.