An asynchronous Low Voltage Detect (LVD) interrupt during the self-test portion of the reset sequence of a microcontroller randomly caused a corrupted clock state that was not recoverable except through a power on reset, or POR. This paper discusses the techniques used to overcome the many obstacles encountered to determine the root cause of the race condition that corrupted the clock state machine registers.

asynchronous state machines, low-voltage detect, microcontrollers, race condition, root cause analysis
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Copyright © 2016 ASM International. All rights reserved.
2016
ASM International
Topics
Semiconductor wafer fabrication Root cause analysis
Issue Section:
Failure Analysis Process
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