Abstract

Visible Light (or Laser) Probing (VLP) is an exciting new development in Laser Voltage Probing (LVP) technology because it promises a dramatic improvement in resolution over current Near Infrared (NIR) solutions [1-3]. To have adequate visible light transmission for waveform probing and modulation mapping, however, ultrathinning of the silicon backside to <2-5 μm is required. The use of solid immersion lens (SIL) technology places additional requirements on sample preparation. In this paper, we present a simple, SIL compatible technique for VLP sample preparation.

failure analysis, laser voltage probing, sample preparation, silicon, solid immersion lens, thinning, visible light probing
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Copyright © 2016 ASM International. All rights reserved.
2016
ASM International
Topics
Specimen preparation Silicon
Issue Section:
Sample Preparation
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