In this study we present a novel method to use a field collapse method together with fully automated near field scanning equipment to construct E- and H-field information of a system during transient ESD events. This inexpensive method provides an alternative way for system designers to validate and analyze the EMC/ESD capability of electronic systems without TLP pulsers, ESD simulators, or precision inductive current probes.
This content is only available as a PDF.
Copyright © 2015 ASM International. All rights reserved.
Issue Section:Scanning Probe Analysis