Abstract
Laser Voltage Probing (LVP) using continuous-wave near infra-red lasers are popular for failure analysis, design and test debug. LVP waveforms provide information on the logic state of the circuitry. This paper aims to explain the waveforms observed from combinational circuitries and use it to rebuild the truth table.
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Copyright © 2015 ASM International. All rights reserved.
2015
ASM International
Issue Section:
Fault Isolation and Defect Localization
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