Abstract

Post silicon validation techniques specifically Focused Ion Beam (FIB) circuit editing and Failure Analysis (FA) require backside sample preparation on Integrated Circuits (IC). Although these preparation techniques are typically done globally across the encapsulated and silicon packaging materials, in some scenarios with tight boundary conditions, only a local approach can be attempted for the analysis. This local approach to access the underlying features, such as circuits, solder bumps, and electrical traces will typically use conventional Laser Chemical Etching (LCE) platforms. The focus of this analysis will be to investigate and conjoin previously published techniques to this local preparation by using a combination of laser sources. A Continuous Wave (CW) and Pulse laser will be used at various processing stages to de-process IC packaging materials silicon and mold compound encapsulation.

This content is only available as a PDF.
You do not currently have access to this content.