Abstract

A field failing Ondax’s 405nm Laser Diode (LD) was under failure analysis. The failure analysis (FA) results showed that the LD was very sensitive to ESD and the degradation was ESD induced. Some mechanism explanation is also given in this paper.

electrostatic discharge degradation, failure analysis, laser diodes
This content is only available as a PDF.
Copyright © 2015 ASM International. All rights reserved.
2015
ASM International
Issue Section:
Posters
You do not currently have access to this content.