Abstract

The most common methodologies for determining whether a component should be judged suspect counterfeit, or not, rely on visual examination, electrical test, and X-ray examinations. While these are commonly sufficient at such determinations, more thorough examinations may be pursued - in particular materials characterizations. In this paper, examples are given in which such “non-standard” methods are employed. Additionally, the results of an investigation as to the applicability of such methods towards detection of surface alteration to facilitate repackaging are described.

This content is only available as a PDF.
You do not currently have access to this content.