Test coverage of embedded memories is often split between test modes. A BIST solution is typically used to isolate and test the memory array through test specific ports. The functional interconnect between logic and memory is tested with traditional ATPG test modes where a bypass cell on the scan chain is used to clock data through the memory. This approach may miss test coverage if the functional path is different from the test path. Although commercial ATPG tools provide some capability in this area, the most advanced type of fault models which target small delay defects or cross talk faults are not as streamlined as they are for traditional fault models. Additionally, more advanced fault types don’t typically have the same diagnostic capability. In this paper, capabilities are developed for maximizing the effectiveness of test on embedded SRAM interconnects in an ATPG context. Also, a method is outlined to characterize and validate the timing robustness of the memory ports and provide a silicon diagnostic capability for localizing critical paths and isolating physical defects.