Abstract

With the advent of three-dimensional stacked integrated-circuit (3D IC), the functionality, performance and power of semiconductor devices has been elevated to a new level. At the same time, the analytical techniques used in the evaluation of 3D IC must also advance in capability. Some new methodologies, based on FPGA products, have been developed to analyze 3D IC failures, all using conventional FA equipment and innovative techniques to achieve a short turn-around time and high success rate. A few case studies will be presented to show the effectiveness of the methodologies.

This content is only available as a PDF.
You do not currently have access to this content.