Abstract

Soft Defect Localization (SDL) is a laser scanning methodology that is commonly used to isolate integrated circuits soft defects. The device is exercised by a functional vector set in a loop manner while localized laser heating stimulates a change in the pass/ fail (P/F) response at the location of the defect or critical path. Although SDL is effective for this purpose, long scan time arising from test overheads, can be a concern to turnaround time for root cause understanding. In this paper, an optimized scheme on synchronous SDL that has a potential to eliminate more than 90% of tester overheads and improve overall SDL test time by at least 17% is proposed. This is achieved by optimizing SDL test loop algorithm.

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