Abstract

Lifted bond balls in Integrated Circuit (IC) have numerous failure mechanisms. A simple external curve can confirm the open, and with package decapsulation, lifted balls can be readily observed. However, the exact cause can be difficult to identify. Most often, a cross section through the balls was performed, but it is far from being able to reveal the reason for lifted bond balls. A comprehensive FA approach is needed. Performing failure analysis through the back side of the die using Scanning Acoustic Microscopy (C-SAM) and Infra Red (IR) inspection helps to observe the conditions of the bond pads. Pulling the die from the mold compound can provide a pristine view of the bond ball-bond pad interface. This allows the detection of contaminants, both organic and inorganic, which cross sections cannot provide.

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