In the past couple years, Space Domain Reflectometry (SDR) has become a mainstream method to locate open defects among the major semiconductor manufacturers. SDR injects a radio frequency (RF) signal into the open trace creating a standing wave with a node at the open location. The magnetic field generated by the standing wave is imaged with a SQUID sensor using RF electronics. In this paper, we show that SDR can be used to non-destructively locate high resistance failures in Micro LeadFrame Packages (MLP).

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