Abstract

One of the biggest problems in the integrated circuit industry as of late has been counterfeiting. Because the counterfeiting process is still quite crude in its nature, visual inspection has become a cornerstone process. This paper discusses the significance of the documentation post decapsulation during internal visual inspection. In order to properly inspect for counterfeit components, it is critical to understand that one inspection method alone will not provide enough information to detect all counterfeits. Proper counterfeit detection involves detailed inspection of multiple aspects of a component in order to gather as much information as possible, so that each component can be successfully labeled counterfeit or authentic. A collaboration of multiple inspection processes, comparison of data amongst sample testing batch, comparison to "known good/golden sample" when possible, and documentation of findings results in the highest confidence level of authenticity of counterfeit labeling of components.

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