Improving the DLS Workflow Available to Purchase

In this paper, we describe improved hardware to connect a semiconductor tester or applications board to a laser scanning microscope (LSM) for performing dynamic laser stimulation (DLS). The hardware, called DXGlue, simplifies the DLS workflow and enables new applications. We describe its precise monitoring of the fail rate and fail mode, its use for time resolved DLS and the enabling of long test loops with short laser dwell times.