The International Symposium for Testing and Failure Analysis (ISTFA) 2010 event added a focus topic on Counterfeiting in Electronics. This topic was chosen because of the emergence of this concern and the critical role that Failure Analysis plays in this challenge. Failure Analysts will be involved deeply as companies worldwide are attempting to reduce the impact of increasing numbers of counterfeit products in the supply line and in fielded products. This paper will attempt to provide an overview of the topic and support the contributors to ISTFA 2010 while providing additional resources for information.

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