Abstract
Scanning acoustic microscopy (SAM) has been in use for the analysis of small devices, mostly ICs, for quite some time. [1] This paper address the use of the technique on larger objects, such as solar panels, PCBs, and brazed cooling plates, the issues that arise, and solutions to mitigate those issues.
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Copyright © 2011 ASM International. All rights reserved.
2011
ASM International
Issue Section:
Poster Session
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