Dynamic Laser Stimulation (DLS) techniques for Soft Defect Localization (SDL) have been well documented for logic devices . More recent literature has broadened the traditional SDL pass/fail mapping by employing multiple device parameters including power analysis , spectrum response , and other analog variations . A practical and efficient implementation of SDL without the use of synchronization or traditional Automatic Test Equipment (ATE) hardware is presented. A dynamic way of analyzing many parameters of mixed signal and analog ICs can be obtained through the use of a high waveform rate oscilloscope, feedback loop, or discrete comparator. Multiple case studies are shown to illustrate the methodology.