Abstract

In this paper, the differential and lockin imaging techniques of Dynamic Photon Emission (DPE) were developed by using highly sensitive near-infrared InGaAs camera in time integrated mode. At first, the setup and method for differential imaging of DPE (DI-DPE) are introduced. The unique debug and pinpointing capability of fails of DI-PEM is discussed in combination with two case studies. Based on DI-DPE, the setup and method for Lockin imaging of DPE (LI-DPE) are then developed for such cases where the correlated DPE is enhanced in strong photon emission background. The correlation in LI-DPE can separate the emission spots from different power domains.

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