Abstract

In this paper, a comprehensive study to find a memory related yield loss in 90 nm technology will be discussed. The loss was related to spacer bridging, blocking silicide formation and Lightly Doped Drain (LDD), source/drain implant. Soft Defect Localization (SDL) techniques [1], sub-micron Atomic Force Microscope (AFM) probing [2] and Time Resolved Emission (TRE) measurements were necessary to obtain an accurate understanding of the problem and the mechanism. Electrical results were compared to simulations. Modified test structures were implemented to monitor the process stability with respect to bridging failures.

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