Soft defects localization by laser techniques on dynamically working ICs is widely used for Failure Analysis (FA). In this context, many AC signal-oriented analysis methods have been introduced to date (SDL, LADA…) or are under development (xVM…). Sophisticated tools are available to localize these kinds of failures but not every FA laboratory has them. By fully exploiting the capabilities of static localization tools, it is possible to deal with timing issues. In this paper, we propose a novel application of the OBIRCh amplifier related to the timing issues on a real case study (mixed-mode device). This novel and very simple application makes the analysis flow time-attractive and enlarges the application field of mapping techniques on the existing tools.

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