In this paper, we demonstrate two applications of time-resolved emission (TRE): measurement of dynamic, local power-supply (Vdd) variations, and synchronous timing jitter induced by Vdd variations. The first technique measures the height of many peaks within a TRE waveform; differences in peak height are correlated with inter- pulse differences in Vdd. The second technique measures the timing of all of the peaks and extracts the inter-pulse timing variations. The measurement was automated and was performed on long (multiple-μs) acquisition windows containing hundreds of emission peaks. Our work advances the state of the art by using the peak heights and positions to extract this information, and by performing the measurements in an automated fashion.