In the failure analysis of semiconductors, layout analysis to pick up suspect nets is getting to be a time consuming work due to finer wiring pitch and multi-layer structure. This article proposes a failure analysis navigation system (FA-Navigation System), which can make it easier to extract the nets passing through the signals detected by the hardware analysis tool, such as emission microscopes or OBIRCH analysis tools. It introduces the functions of the system and shows some case studies in actual failure analyses. The IDDQ fault diagnosis is especially useful for case studies. The result of the software diagnosis can be loaded in the analysis window of the FA-navigation system, and the system correlates the result to the nets extracted by the hardware analysis and displays coincident nets in a sorted manner to make the failure analysis easier.

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