The electrical interface, in terms of a reliable, low ohmic and defined connection with the device or die is the most relevant aspect in the characterization of products. Bad or undefined contacts inhibit an exact assessment of the functionality. This paper describes different contact related failures analyzed in our lab and gives the solutions we used to solve the problems. Especially an electroless (nickel)-gold plating method has been optimized and is described in details. Low ohmic and reliable contacts can be produced; the paper shows several applications to improve the contact quality in different domains of the failure analysis business

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