Abstract
Bridging faults are a common failure mechanism in integrated circuits and scan-based diagnosis does a good job of isolating these defects. Diagnosis, however, can sometimes result in large search areas. Typically, these areas are caused by long repeater nets. When this happens, physical failure analysis will become difficult or impossible. This paper concerns itself with using a bridging fault analysis as a means of reducing these large search areas.
This content is only available as a PDF.
Copyright © 2004 ASM International. All rights reserved.
2004
ASM International
Issue Section:
Die Level Fault Isolation
You do not currently have access to this content.