For certain programmable logic type devices, the electrical, morphological and failure location differences in the ESD signatures between ICC failures and I/O leakage failures have been identified. Based on these electrical, morphological and physical failure signature locations, this case study confirms that distinctions can be made between the signatures associated with the likely stress modes for pin combinations like I/O-to-Vss, I/O-to-Vcc, I/O-to-I/O, Vssto- Vcc and Vcc-to-Vss. This separation also facilitated the correct identification of core failures which are mostly due to the supply-to-supply pin combination stress, but in some cases are due to the pin-to-supply tests.

This content is only available as a PDF.
You do not currently have access to this content.