The transfer functions of the bias/detection circuits used in various laser signal njection microscopy (LSIM) techniques, especially for those using constant current bias/detection schemes, are largely unknown. This article provides both qualitative and quantitative measures of various LSIM bias/detection schemes to develop a more complete understanding of the varying measurement systems. The authors have measured the characteristics of a variety of bias/detection circuits in ways that are similar to the characterization of a linear integrated circuit. They have concentrated on examining the frequency response, pulse response, and noise levels. It was found that the LSIM bias/detection systems have widely varying characteristics which, in turn will affect how they can be optimized. Furthermore, the relationship between the frequency and noise characteristics of the bias/detection systems and the input signal that is to be detected point to differing ways in which the systems can be modified for improved performance.

This content is only available as a PDF.
You do not currently have access to this content.