Abstract

Light Emission due to Off-State Leakage Current (LEOSLC) is used in combination with the Picosecond Imaging Circuit Analysis (PICA) method to effectively diagnose and localize defects in a broken scan chain. As usual, the emission base method shows to be very effective in debugging the problem; the defect is successfully identified by the optical technique and confirmed by Physical Failure Analysis (PFA).

This content is only available as a PDF.
You do not currently have access to this content.