This paper presents IDDQ testing for LED integrated with IC module (ICM) circuit. To begin, brief introduction to IDDQ testing, the purpose and failure detectable with this method in CMOS IC context will be discussed. Then, the explanation will be focalized to ICM package and failure detectable with this method. A simulation and case study will be presented to show the usefulness of this testing. The results show that IDDQ testing is not only efficient in detecting intrinsic IC failure but also SMT process related problem like intermittent contact. Nonetheless, the discussion is merely conceptual and intended to give reader an idea of how IDDQ testing can be fully utilized in IC module testing, not the details of implementation.

This content is only available as a PDF.
You do not currently have access to this content.