Diagnosing DACS (Defects That Affect Scan Chain and System Logic)

In this paper, DACS stands for Defects that Affect Chain and System, which could be any type of silicon defects caused by an unintentional interaction between a scan chain signal and a system logic signal. The device could fail scan chain testing or show up as a latent failure in the customer’s system. A novel diagnosis methodology is proposed to locate both ends of a DACS. The proposed algorithm can be generally applied to any type of DACS. Experimental results on industrial chips demonstrate the effectiveness of the proposed method.