In this paper, we will present our solution to the problem of test based fault localization in the failure analysis laboratory environment. The test system described herein is currently used for a number of high power mixed signal application specific integrated circuits (ASICs) that incorporate functions including switching power supplies, charge pumps, high current drivers, precision references, ADCs/DACs, comparator circuits, and digital cores. The solution addresses the shortcomings of alternative options through modular construction, compact size, and use of a commercially available graphical software compiler to create the control code and graphical user interface (GUI).

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