Abstract

In this paper, we will present our solution to the problem of test based fault localization in the failure analysis laboratory environment. The test system described herein is currently used for a number of high power mixed signal application specific integrated circuits (ASICs) that incorporate functions including switching power supplies, charge pumps, high current drivers, precision references, ADCs/DACs, comparator circuits, and digital cores. The solution addresses the shortcomings of alternative options through modular construction, compact size, and use of a commercially available graphical software compiler to create the control code and graphical user interface (GUI).

This content is only available as a PDF.
You do not currently have access to this content.