Abstract

In this paper, a failure analysis case, which uses a dynamic operation technique and MgCdTe (MCT) camera to isolate single scan-chain failed cell is demonstrated. Improved results obtained using the MgCdTe (MCT) camera is compared with traditional Si CCD camera. Scan-chain cell schematic and failure mechanism is also presented to explain why static bias conditions are insufficient to detect this failure.

This content is only available as a PDF.
You do not currently have access to this content.