Abstract
Commonly used timing measurement tools are often limited to probing a circuit running at one single frequency [1,2]. In reality, multiple frequencies may be present on chip, and that can lead to timing problems which render the chip inoperable within certain frequency ranges. We will describe a simple modification to a Picosecond Imaging Circuit Analysis (PICA [3]) instrumentation whih permits the simultaneous measurement of timing in multiple frequency domains.
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Copyright © 2002 ASM International. All rights reserved.
2002
ASM International
Issue Section:
Optical Probing
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