The ongoing challenge of test is to obtain high quality at a reasonable cost. Increasing design complexity, signal integrity, and power issues mean that design-for-testability (DFT) and design-for-diagnosibility (DFD) can no longer be treated as an add-on. Similarly, serious attention is needed for parametric testing or the cost requirements for GHz frequency test will be prohibitive. Is the industry ready for the challenge?

design-for-diagnosibility, design-for-testability, failure analysis, parametric testing, semiconductor design complexity, signal integrity
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Copyright © 2001 ASM International. All rights reserved.
2001
ASM International
Topics
Semiconductor wafer fabrication
Issue Section:
Defect-Based Testing
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