Abstract

The ongoing challenge of test is to obtain high quality at a reasonable cost. Increasing design complexity, signal integrity, and power issues mean that design-for-testability (DFT) and design-fordiagnosibility (DFD) can no longer be treated as an add-on. Similarly, serious attention is needed for parametric testing or the cost requirements for GHz frequency test will be prohibitive. Is the industry ready for the challenge?

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