Abstract
Electrical overstress (EOS) is a common failure cause for many of the electronic circuits today. The Failure Analyst has no difficulty identifying EOS as the cause of the failure. The difficulty comes from determining the source of the EOS event so it can be eliminated. This paper describes two case studies looking a gross EOS damage and very mild EOS damage. Close cooperation between the customer and vendor was required to determine the source of the EOS events.
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Copyright © 2001 ASM International. All rights reserved.
2001
ASM International
Issue Section:
Case Histories
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