Production had been halted on an electronic system due to sudden and unexplainable shifts in the resistance values of some Cermet poteniometers. This paper describes the method used to confirm that the problem was due to an ESD environment.

cermet trim poteniometers, electronic systems, electrostatic discharge, failure analysis
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Copyright © 1998 ASM International. All rights reserved.
1998
ASM International
Topics
Semiconductor wafer fabrication Electrical resistance
Issue Section:
ESD
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