Temperature Dependence of Quiescent Currents as a Defect Prognosticator and Evaluation Tool

The dependence of a defective device's voltage-current characteristics on temperature is studied, both from a theoretical perspective and through a series of actual case studies. The shape of the current vs. temperature curve is shown to be a good prognosticator of the defect type, and as such a valuable complement to other non-destructive defect characterization techniques such as photoemission spectrum analysis [1].